C-testable one-dimensional ILAs with respect to path delay faults: theory and applications

In this paper we give, for first time in the open literature, sufficient conditions so that a one-dimensional iterative-logic-array (ILA) is C-testable taking into account the path delay fault model. We give also a method for path selection so as all the selected paths can be tested by a constant number of test-vector pairs. The delay of all other paths is a function of the delays of the selected paths. As example, we consider the ripple-carry adder and the group carry look ahead adder with ripple carry between groups.