Design of 1Mbit RRAM memory to replace eFlash

A 1Mbit RRAM memory robust against variations in 45nm technology is presented. The focus lies on read reliability. To overcome variability a tuned reference signal is generated by connecting multiple reference cells in parallel. A bitline load has been designed to obtain maximum bitline voltage difference. Sense amplifier performance has been improved by allowing overlap between passgate-enable and latch-enable signals, this overlap gives rise to a nonlinear phenomenon, the RC-latch-effect. Write operation has not been included in the design and the results are based on circuit simulations.