On the implementation of the LZZ calibration technique in the S-parameters measurement of devices mounted in test fixtures

This paper introduces a methodology for the design and verification of the set of microstrip structures necessary to implement the line, offset-open, offset-short (LZZ) calibration technique in the small-signal characterization of devices mounted in coaxial-to-microstrip test fixtures. The usefulness of the LZZ calibration in such application is verified by comparing the S-parameters of a GaN-HEMT packaged transistor corrected using the LZZ with those corrected using the thru-reflect-line (TRL) calibration technique.