Modeling Of Aging Of Solid Dielectric Materials In Multiple Stress Environment

This paper describes the results of efforts to develop models of aging mechanisms of insulation materials used in solid dielectric power transmission cables. The models will be used as the basis for the development of an accelerated life test for such cables. The authors attempt to include the effects of simultaneous application of up to five stresses, such as temperature, temperature gradient, electrical field, frequency, and mechanical load. The paper describes two different modling approaches, the first emphasizing the reaction kinetics of the decomposition of the dielectric material. The second approach is based on a response surface methodology. The kinetic models are principally concerned with mechanisms during the pre-tree formation, induction period, while the response surface treatment focuses on cable life without undue concern about mechanisms.