Arbitrary band-limited pulse generation for built-in self-test applications

This paper describes a new technique to generate a variety of arbitrary band-limited pulse shapes that can be used efficiently in built-in self-test applications. The proposed method requires very little area and the same hardware can be used to generate pulses of different shapes. This is particularly useful in testing receivers with different pulse shapes coming from the transmission medium such as a twisted pair cable. Experimental results from an on-chip CMOS generator are also be given.