Integrated near field scaning system for high frequency deivces

In electromagnetic interference (EMI) investigation, localization of real EMI sources in the near-field region is always in concern. This paper introduces an integrated near-field scanning system (INFSS) that handles electromagnetic near-field measurement of arbitrary three-dimension (3D) shape of high frequency devices in conjunction with numerical modelling and simulation results. It performs both finite element method (FEM) based numerical simulation and 3D near-field scanning function that help engineer to increase the project development efficiency and reduce the development time cost. A case study of a dual mode switch parasitic antenna is presented from design to measurement using INFSS.