Wideband characterization of dielectric material by new approaches based on near field microwave microscopy

We present in this paper an electromagnetic model based on finite elements method for the characterization of dielectric samples with a near field microwave microscopy, this proposed model is a useful tool to determine for, a given microcopy probe, the minimum substrate thickness required to extract accurately the substrate relative permittivity and loss tangent. This paper proposes a practical application with a wideband characterization apparatus.