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Study of induced strain in silicon rib structures | IEEE Conference Publication | IEEE Xplore

Study of induced strain in silicon rib structures


Abstract:

This paper reports a theoretical and experimental study on induced strain in silicon-based rib structures. Simulations of induced stress and strain distribution were perf...Show More

Abstract:

This paper reports a theoretical and experimental study on induced strain in silicon-based rib structures. Simulations of induced stress and strain distribution were performed for nitride-strained silicon; moreover, locally-accurate strain measurements were performed on manufactured rib structures in proximity of the nitride-to-silicon interface employing the Convergent Beam Electron Diffraction (CBED) technique. The study resulted in good accordance between simulated and measured strain behaviors along the rib cross-section, indicating the possibility to achieve significant strain levels (e.g. higher than 2 mε for the εzz strain tensor component).
Date of Conference: 27-29 August 2014
Date Added to IEEE Xplore: 24 November 2014
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Conference Location: Paris, France

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