Behavior of light-induced degradation for temperature cycling test

We observe the different test tendency for P-mono and P-multi PV module after temperature cycling test. The output power decreases for P-multi PV module after temperature cycling test. While for P-mono PV module, the broken grid fingers are also found from the electro-luminescence image, the output power increases after testing. We compared the no pre-condition and pre-condition PV module in temperature cycling test. The performance of the pre-condition P-mono PV module is recovered due to applying a current and high temperature during temperature cycling test. Furthermore, the no pre-condition P-mono PV module causes light-induced degradation and the annealing effect with applying Imp current during temperature cycling test. This phenomenon is related to the pre-condition. In this study, light-induced degradation and recovery effect are investigated and correlated in both cell and module level. We prove the recovery effect during temperature cycling test, and provide a way for the reliability test of P-mono PV module.