Future Trends in I&M [Trends in future I&M]

This is my first column on the "Future Trends in I&M," and let me thank you, first of all, for your patience in reading the column and the editor-in-chief of this magazine, Dr. Wendy van Moer, for giving me this opportunity. When she first contacted me and asked me to contribute to the Instrumentation and Measurement Magazine on a regular basis, I was amazingly surprised and asked her why she selected me for a column that requires an insight into the I&M field that I do not feel I have. Wendy's answer was even more surprising than the original proposal. She selected me because I'm one of the recipients of the IEEE Instrumentation and Measurement Society Outstanding Young Engineer Award, and as such, I should be, in her opinion, young and brilliant.