COTS FPGA/SRAM irradiations using a dedicated testing infrastructure for characterization of large component batches

This paper introduces a new testing platform for irradiation of large batches of COTS FPGA and SRAMs. The main objective is measurement of component radiation response and assessment of component-to-component variability within one batch. The first validation and test results using the testing platform are presented for 150nm TFT SRAM (Renesas) and different sizes of the 130nm ProASIC3 FPGA (Microsemi).