Highly Dynamic Current Measurements with Inductive Current Sensors - a Numerical Recipe

With the development of extremely fast switching semiconductors such as SiC and GaN, the current measurement technologies have to adapt to this evolution. This paper presents a current measurement method for measuring the current flow through a single semiconductor switch in a test setup with a high bandwidth and no additional stray inductance. In difference to previous papers, this one will focus on all numerical steps that should be done, including the calibration, to reconstruct the original current waveform out of the measured induction voltage in order to reach a high accuracy.