Teflon wetting and dewetting on EWOD device for chemiluminescence detector

A hydrophobicity recoverable EWOD (electrowetting-on-dielectric) based chemiluminescence detector with an integrated signal and heater electrode was developed. X-ray-photoelectron-spectroscopy (XPS) was used to reveal the wetting and dewetting mechanism of Teflon on the EWOD device. It was found that the C-O bond formed on the surface of Teflon after the chemiluminescence reaction leaded to the surface permanent wetting. To recover the contact angle of the Teflon surface, the recovery threshold time and heating temperature were proposed experimentally for dewetting to release C-O bond.