FaSEA: Fast single-trunk detailed router for electromigration avoidance

The operating current in analog circuit is typically much larger than that in digital circuits. Electromigration due to large current and insufficient wire width can cause both short-circuit and open-circuit failures, which may lead to circuit malfunctions. Such electromigration issues become increasingly important because the feature sizes keep shrinking. Existing works on electromigration-aware routing mostly focus on wiring topology computation without considering obstacles. Such wiring topologies can result in degraded detailed routing solutions due to routing obstacles and ineffective detailed routers. In this paper, we present a new efficient detailed router, called FaSEA, for electromigration avoidance based on a single-trunk heuristic. FaSEA can obtain a detailed routing solution for a given multiterminal net with multiple current sources and sinks, which avoids obstacles and satisfies Kirchhoff's current law with variable wire widths. Experimental results are promising and show the effectiveness of FaSEA.