Design-for-testability automation of mixed-signal integrated circuits | IEEE Conference Publication | IEEE Xplore

Design-for-testability automation of mixed-signal integrated circuits


Abstract:

The methodology to computer-aided design-for-testability (DFT) of mixed-signal IC is proposed. Functional model of DFT-automation is presented as IDEF0-diagram based on t...Show More

Abstract:

The methodology to computer-aided design-for-testability (DFT) of mixed-signal IC is proposed. Functional model of DFT-automation is presented as IDEF0-diagram based on the system analysis. The purpose and principal realization of the key DFT processes in the model are considered. The decision criterions of effective DFT-solution for particular mixed-signal circuit design are proposed. The features of testing circuitries library are descried. Experimental results of the methodology application for analog-digital ADPCM codec are presented.
Date of Conference: 04-06 September 2013
Date Added to IEEE Xplore: 27 February 2014
Electronic ISBN:978-1-4799-1166-0

ISSN Information:

Conference Location: Erlangen, Germany

References

References is not available for this document.