Loading web-font TeX/Main/Regular
High Mobility Bilayer Metal–Oxide Thin Film Transistors Using Titanium-Doped InGaZnO | IEEE Journals & Magazine | IEEE Xplore

High Mobility Bilayer Metal–Oxide Thin Film Transistors Using Titanium-Doped InGaZnO


Abstract:

We report a high performance indium-gallium-zinc oxide (IGZO)/IGZO:Ti bilayer metal–oxide thin-film transistor (TFT) with a low drive voltage of {<}{\rm 2}~{\rm V}. Com...Show More

Abstract:

We report a high performance indium-gallium-zinc oxide (IGZO)/IGZO:Ti bilayer metal–oxide thin-film transistor (TFT) with a low drive voltage of {<}{\rm 2}~{\rm V}. Compared with conventional IGZO TFTs, the novel bilayer metal–oxide TFTs through IGZO thickness modulation can reach the lowest off current of 1.6\times 10^{-11}~{\rm A}, smallest sub-threshold swing of 73 mV/decade, and highest mobility of 63 {\rm cm}^{2}/Vs, which may create the potential application for high resolution display.
Published in: IEEE Electron Device Letters ( Volume: 35, Issue: 1, January 2014)
Page(s): 87 - 89
Date of Publication: 06 December 2013

ISSN Information:


Contact IEEE to Subscribe

References

References is not available for this document.