Terahertz imaging for nondestructive inspection of materials including conductive microparticles

THz imaging for nondestructive inspection of the materials including conductive microparticles has been studied by use of FDTD analysis and THz spectroscopy. The allocated conductive particles causes the scattering for THz-wave. Though the scattering factor depends on the frequency, a frequency selected wave would be suitable for nondestructive inspection.