tLIFTING: An open-source multi-level fault simulator for ionizing effects

This paper presents a multi-level simulator tLIFTING for fault simulation in digital circuits. Multi-level simulation is used for precision of the information of the fine grain transistor level and the conciseness of the coarse grain logic level. This multi-level process allows handling natural and maliciously induced physical phenomenon leading to circuit misbehavior, while dealing with large circuits.