Practical implementation of a sequential sampling algorithm for EMI near-field scanning

In this paper, a practical implementation of a recently proposed automatic and sequential sampling algorithm for the near-field scanning of printed circuit boards and/or integrated circuits is presented. The sampling algorithm minimizes the required number of sampling points by making a balanced tradeoff between `exploration' and `exploitation'. Moreover, at every moment analytical models for the complete near-field pattern can be computed by means of Kriging. By comparing successive models, an automatic stopping criterion can be implemented. The performance and effectiveness of the proposed sampling algorithm is tested on a number of simple printed circuit boards and compared with that of the traditionally used uniform sampling.