Characterization of quarter wavelength line as measurement standard for scattering parameter in the frequency range of W-band and D-band

This paper summarizes the technique to characterize quarter wavelength lines of rectangular waveguides as measurement standards for scattering parameters. The scattering parameters and their uncertainties were theoretically calculated using their dimensions. The SI traceability was established for the standard in the frequency range of W-band (from 75 GHz to 110 GHz) and D-band (from 110 GHz to 170 GHz).