I/sub CCQ/: a test method for analogue VLSI based on current monitoring

This paper introduces a test method for analogue (parts of) ICs that determines whether an IC is good or not by measuring the currents flowing through its constituent circuits. The I/sub CCQ/ test method is not a full functional test. It is aimed primarily at finding faulty circuits during wafer testing. Both static and dynamic currents can be tested with this test method.