Calibration measurements down to 50nm with photon correlation nano LDA

Photon correlation LDA was developed for process monitoring of nanoparticle fabrication. The system measures particle number, velocity and size of submicron particles simultaneously. The backscattering arrangement assures the online, in-situ, non-invasive measurements without further fine tuning. Compared to single particle counters the system works with much higher resolution in particle sizing and velocity measurements. High resolution measurements can be performed also in space and time to provide new insights in fundamental processes such as nanoparticle growth and motion. It was shown with monodisperse for silicon oxide particles in calibration measurements, that the lower detection limit is around 50nm and the size resolution is below 10nm.