Space Domain Reflectometry for open failure localization

Space Domain Reflectometry (SDR) is a newly developed non-destructive failure analysis (FA) technique for localizing open defects through the imaging of magnetic field produced by a radio frequency (RF) current induced in the sample. The technique employs a Scanning Superconducting Quantum Interference Device (SQUID) RF Microscope and is capable of locating open failures with 30μm accuracy. Here we present a theory of SDR and show examples of locating opens in various integrated circuit (IC) package samples.