Fabrication and characterization of single Nb/NbxSi1−x/Nb Josephson junction for voltage standard

We report in CPEM 2012 our effort towards SNS Josephson junction devices for the quantum voltage standard. A single-junction SNS device, with Nb as the superconductor material (S) and Nb_xSi_1-x alloy as the barrier material (N), is fabricated and tested for the first time by NIM (National Institute of Metrology). A I-V characteristic curve of the junction is measured and the experimental results are discussed in this paper.