Mismatch analysis using pulsed electro-optic sampling at KRISS

A mismatch analysis system for microwave devices based on the electro-optic sampling technique is presented. We, KRISS (Korea Research Institute of Standards and Science), have recently developed a time domain electro-optic sampling system for high speed pulse analysis and utilized it to explore mismatch characteristics of a microwave device under test in the spectral domain. The performance of our system, based on pulse measurements in both time and frequency domains, are presented by exploring mismatches of a microwave device associated with a 20 GHz transmission line.