Evaluation of low-ohmic resistance measurement capabilities between VSL and NIST

The low-ohmic resistance measurement capabilities of the Van Swinden Laboratorium (VSL) and the National Institute of Standards and Technology (NIST) were compared using a set of resistors with values 100 mΩ, 10 mΩ, 1 mΩ, and 100 μΩ respectively. The measurement data of both laboratories generally agree well within the combined measurement uncertainties, ranging from 0.54 μΩ/Ω at 100 mΩ to 4.3 μΩ/Ω at 100 μΩ (k = 2). Careful transport of the resistors was crucial for achieving this result.