Multi-site test of RF transceivers on low-cost digital ATE

In this paper we present a concept and its implementation for the productive quad-site test of a state-of-the-art 2G/3G RF transceiver device on a low-cost purely digital ATE. Our approach is based on calibrated reference RF transceiver device used as a compact, low-cost RF signal source and RF measurement instrument. The reference device along with supporting analog and digital circuitry for pattern control and test data handling is placed on PCB modules plugged on-top the test DUT board one for each site. The design of the modules, the DUT boards and the software is explained in the context of mass production, and measurement results are given.