The contribution of contact in non-linearity of CV characteristic of thick film resistor

The work deals with thick film resistors and their properties. The structures of resistive and conductive thick film layers were prepared by screen-printing by polymer thick film pastes. Samples were exposed to accelerated ageing in environment with enhanced temperature and humidity. Tested sample consist of thick film resistors with different width and length. The non-linearity of current-voltage characteristic of resistors was measured. The measured resistor include not only resistive layer but also interface between conductive and resistive layers. The influence such interface is analyzed.