Built-in parametric test for controlled impedance I/Os

A test method for functional and parametric test of I/Os has been developed. This method allows I/Os to be tested in parallel by use of a common DC supply instead of individual tester channels and pin electronics. Full DC parametrics on inputs and outputs, and full speed AC tests, can be performed on lower cost ATE. Both single-ended and differential signal I/Os are handled. Differential measurements are taken on differential I/Os. This test method works on I/Os using short circuit proof drivers with controlled impedance.