A semi-empirical method for predicting single event upset rates: current technology applications

This paper presents systems engineering approach to the prediction of single event upset (SEU) rates due to direct ionization. The Device-Mission System will be introduced and applications be presented. Results of predictions performed for the Hitachi 1 Mbit SRAM currently onboard the Cosmic Ray Upset Experiment (CRUX) based on flight lot experimental test data will be compared to flight data. Addition, results for three CRUX SRAMs compared with flight data and with results of other SEU prediction methods performed using the same input of generic test data set and environment spectra.