Parameters variability effects on microstrip interconnects via Hermite polynomial Chaos

This paper focuses on the derivation of an enhanced transmission-line model allowing to describe a realistic high-speed interconnect with the inclusion of external uncertainties, like tolerances or process variations. The proposed method, that is based on the expansion of the well-known telegraph equations in terms of Hermite polynomials, turns out to be accurate and more efficient than alternative solutions like Monte Carlo in determining the transmission-line response sensitivity to parameters variability. Two application examples involving the frequency-domain analysis of realistic PCB microstrip structures conclude the paper.