Fault location based on circuit partitioning

We propose a method of fault diagnosis that reduces the number of simulations required to locate defect site(s) by logically partitioning the circuit into subcircuits. Candidate subcircuits that potentially contain the defect site(s) are identified and further partitioned, until the defect site is located with the required resolution. Experimental results are presented to demonstrate the effectiveness of circuit partitioning in reducing the number of fault simulations.