Scan design oriented test technique for VLSI's using ATE

A new test technique to localize failures of devices with scan design easily and quickly using LSI tester is proposed. This technique allows device designers or test engineers to localize the scan Flip Flops that failed using expressions based on the scan design of the device. These devices are defined by the Boundary Scan Description Language (BSDL) or an extension to BSDL proposed in this paper. This technique can be applied to standard boundary scan designs and to ad-hoc internal scan implementations. Furthermore, restrictions from limited tester resources has been solved by technique. As a result, it is possible to speed-up of the failure analysis resulting in a decrease of the test costs.