Influence of Ion Bombardment on Electron Emission of MgO Surface in AC Plasma Display Panel

The influence of ion bombardment during a sustain discharge on the electron emission of the MgO surface and related driving characteristics of an ac plasma display panel were examined using the cathodoluminescence technique and SIMS analysis. The experimental results showed that severe ion bombardment predominantly sputtered Mg species from the MgO surface, thereby lowering the intensity of the F⁺ center peak to 3.2 eV due to the elimination of the oxygen vacancy and finally increasing the formative address delay time (Tf) due to an aggravated electron emission capability. Meanwhile, severe ion bombardment also destroyed the shallow trap level, thereby lowering the intensity of the shallow peak to 1.85 eV and eventually increasing the statistical address delay time (Ts) due to a poor electron emission capability from the shallow level. Finally, the aggravated electron emission capability from the shallow level resulted in a reduced wall voltage variation during the address period.