Improved sine-wave parameter estimation for A/D converter testing

An improved sine-wave parameter estimation algorithm is described and analyzed. It allows us to perform the standard "curve fit test" on A/D converters employing sine waves with amplitude greater than the full-scale range of the device. The speed and stability performance of the algorithm, which overcomes the problems of the standard methodology assuring highly accurate and repeatable measurements of the "effective numbers of bits", are studied and illustrated in detail. The metrological requests on the signal generator employing the new methodology are also discussed.