An EMF activity tree based BPEL defect pattern testing method

For testing BPEL defects efficiently, a novel BPEL defect pattern testing architecture based on the EMF activity tree technology is proposed. The EMF activity tree that is similar to abstract syntax tree is used to describe the BPEL service process structure. The mapping method from the DOM object tree of a BPEL file to the EMF activity tree and the recursive algorithm to generate an EMF activity tree are represented in detail. A typical EMF activity tree is shown and the visitor design pattern based traversal method is stated. The directions to enhance this technology are illustrated finally.