C-17 O-level fault detection and isolation bit improvement concepts

C-17 avionics built-in test (BIT) improvement is critical to mission readiness and capability. While many dramatic successes in 1995 led to the Department of Defense decision to build 120 C-17 airlifters, one area that still warrants improvement is a reduction in cannot-duplicate (CND) failure conditions. The primary goal of the MDA internal research and development (IR&D) maintenance diagnostics/fault data analysis and reporting (MD/FDAR) project is line-replaceable unit (LRU) CND reduction; a corresponding benefit is the transformation of raw recorded aircraft data into more useful maintenance information.