An approach to outlier detection based on Bayesian probabilistic model | IEEE Conference Publication | IEEE Xplore

An approach to outlier detection based on Bayesian probabilistic model


Abstract:

The problem of outlier detection is considered with reference to a piecewise-smooth signal corrupted by background Gaussian noise plus spikes. The problem of estimating t...Show More

Abstract:

The problem of outlier detection is considered with reference to a piecewise-smooth signal corrupted by background Gaussian noise plus spikes. The problem of estimating the variance of background noise is considered and a robust algorithm which solves the problem in such an environment is suggested. The estimate of variance is essential for an outlier detection algorithm as well as for different algorithms for signal (image) analysis. Our approach to outlier detection is based on a Bayesian probabilistic model. The model enables selection of a set of informative tests for outlier detection. An experimental algorithm based on this approach is tested and its comparison with the median based approach is presented.
Date of Conference: 25-29 August 1996
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-8186-7282-X
Print ISSN: 1051-4651
Conference Location: Vienna, Austria

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