Research of through breakdown dielectric envelope in vacuum and gas-discharge electronic tubes with the operating voltage 50-300 kV

Work has been carried out in Russia to investigate processes that influence the decrease of dielectric strength of electronic devices with operating voltages between 50-300 kV. Particular attention has been given to investigation of processes that are responsible for the through breakdown of the dielectric envelope which leads to loss of hermetic seal of tubes. On the basis of this research work and of the analysis of the charge processes on the dielectric surface, a mechanism of envelope breakdown was proposed and verified experimentally.