Simulation of the test process for analogue integrated circuits

The paper describes a new implementation of testing-algorithm model for analogue and mixed-signal circuits with neural network evaluation. The simulation system is programmable (different fault models, input stimuli, and different analyses), it covers a wide spectrum of test methods and desired post-process techniques. It is based on the possibilities of HSPICE and MATLAB to manage whole test simulation including the simulations of faulty or fault free circuits as well as post-processing by means of a neural network classifier. The approach takes into account tolerances deviations on parameters. The aim of this project is to model test techniques in order to classify their effectiveness in the sense of fault coverage. The system was verified on practical test tasks.