Research and Implementation of Test Pattern Generation Based on General structure Model of SOC

The test vector generation algorithm and the compression algorithm based on general structure model of SoC was introduced in this paper. We have analyzed the PODEM algorithm for test vectors generation and translated the test pattern, and then formed the SoC general structural model test vector. Through the experimental comparison, we find the use of Golomb coding for test vector compression/decompression method is simple and effective, and test data compression rate improved by using the minimizing Hamming distance sorting algorithm to compress and decompress the test vector significantly.