Multiport de-embedding technique for balanced varactor high frequency characterization

The present work proposes a simple Pad/Thru de-embedding method for multiport S-parameter measurements of differential varactors. The Pad/Thru method is compared to Open/Short de-embedding and leads to the following strengths: reduction of the wafer area required for dummy structure and reduction of the number of measurements required to characterize and de-embed each devices.