A serially addressable, flexible current monitor for test fixture based I/sub DDQ//I/sub SSQ/ testing

The Quality Test Action Group (QTAG) was formed at the 1993 International Test Conference to define a standard for test fixture based off-chip quiescent current monitors for use in the production testing of CMOS integrated circuits. These quiescent current monitors will provide the I/sub DDQ//I/sub SSQ/ test instrumentation that is needed by the semiconductor industry. This paper proposes a standard serial interface to be used by ATE systems to communicate with the QTAG quiescent current monitors.