Research on image acquisition system applied to profile measurement

Profile measurement plays an important role in machine vision. Profile imaging quality, affected by illumination, scattering characteristics, and other factors, directly determines the accuracy and repeatability of profile measurement. An image acquisition system featured with parallel projection achieved by the use of telecentric optics and parallel illumination is proposed in the study. Influencing factors of profile image acquisition are analyzed in detail. Mathematical formulas are presented for calculation of related parameters. Experimental results show that the proposed image acquisition system can efficiently improve the profile imaging quality and is beneficial to profile measurement.