Software BIT design and testing for embedded software

Build-in-test of software is designed in embedded system widely. This paper analyses the general architecture of the embedded system, introduces three types of BIT structure pattern, for each pattern, the arithmetic design is described in details with real practice. This paper presents a new s/w BIT approach based on fault injection. Four important phrases: testing requirement analysis, fault injection, testing design and result analysis are described thoroughly in this approach. The ending part is the summery of the paper.