A new clock-feedthrough cancellation method for second-generation switched-current circuits

In second-generation switched-current circuits, the effect of charge injection, which manifests itself as clock-feedthrough, seriously affects the accuracy of the sampling operation which is required by any sampled-data system. In this paper a new method is proposed to tackle the problem of clock-feedthrough in the second-generation circuits. This method is based on the use of a "dummy circuit" which superposes the same amount of error in the opposite direction. The technique can be applied to any second-generation cell such as the current memory and the delay cell. SPICE simulations are performed which verify the feasibility of the proposed technique in cancelling clock-feedthrough effects.