Electronic and structural properties of thin SrF/sub 2/ films on InP

In this paper we present the results of our experiments on the deposition of SrF/sub 2/ on InP. Four different substrates were used for these investigations: HF-etched and as-treated InP(100) and (111)B. On these surfaces 35-50 /spl Aring/ SrF/sub 2/ was deposited at room temperature. We also studied the changes in the films due to annealing. To clarify the morphology of the films: transmission electron microscopy (TEM) and atomic force microscopy (AFM) were employed.