Fast solution of electromagnetic scattering from thin dielectric coated conducting structures by improved EFIE

To enhance computational efficiency of the PEC-TDS method[1,2], the improved electric field integral equation (IEFIE) proposed by us [3] is extended for accelerating solution of thin dielectric coating structures in this paper. By adding the principle value term of magnetic field integral equation (MFIE) into electric field integral equation (EFIE), a well-conditioned improved EFIE can be achieved. In this paper, MLFMA is implemented in the IEFIE to compute scattering from complex conducting structure coated by thin dielectric material. Numerical results demonstrate the efficiency and validity of the present method.