Coupled numerical and field-theoretical computation of the effects of circuit-package interactions on the linear and nonlinear performance of active MMIC's

The linear and nonlinear performance of packaged active microwave circuits is evaluated by a novel technique based on a combination of EM theory and numerical analysis. The metal enclosure is treated as a scatterer that radiates back the incident field generated by the unpackaged circuit, and the effects of such scattered field on circuit performance are evaluated by the reciprocity theorem. The results compare favorably with those produced by FEM and FDTD/FIT methods.