Built-in self-test approaches for analogue and mixed-signal integrated circuits

The increasing complexity of analogue/mixed-signal integrated circuits is leading test engineers to propose self-test capabilities for these types of circuits. The use of on-chip structures for the test of analogue and mixed-signal parts allows for significant savings in expensive test equipment and reduces the chip cost. This field has been the subject of substantial research over the last few years. This paper presents a survey of the most significant analogue and mixed-signal built-in self-test approaches.